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Beam Diagnostics in Superconducting Accelerating Cavities : the Extraction of Transverse Beam Position from Beam-Excited Higher Order Modes

Author: Pei Zhang
Publisher: Cham : Springer International Publishing, 2013.
Series: Springer Theses, Recognizing Outstanding Ph. D. Research
Edition/Format:   eBook : Document : EnglishView all editions and formats
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This book provides a detailed survey of various dimension reduction methods applicable for rf diagnostics. It is an ideal resource for students new to the field as well as for scientists well-versed  Read more...

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Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Pei Zhang
ISBN: 9783319007588 3319007580 9783319007595 3319007599
OCLC Number: 861540740
Description: 1 Online-Ressource
Contents: Introduction.- Electromagnetic Eigenmode Simulations of the Third Harmonic Cavity.- Measurements of HOM Spectra.- Analysis Methods for Beam Position Extraction from HOM.- Dependencies of HOM on Transverse Beam Offsets.- HOM-Based Beam Position Diagnostics.- Conclusions.- Bibliography.- Mathematics.- Eigenmodes of an Ideal Third Harmonic Cavity.- Technical Details of the HOM Measurements.
Series Title: Springer Theses, Recognizing Outstanding Ph. D. Research
Responsibility: by Pei Zhang.

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Primary Entity

<http://www.worldcat.org/oclc/861540740> # Beam Diagnostics in Superconducting Accelerating Cavities : the Extraction of Transverse Beam Position from Beam-Excited Higher Order Modes
    a schema:Book, schema:CreativeWork, schema:MediaObject ;
    library:oclcnum "861540740" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/gw> ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/1654673941#Place/cham> ; # Cham
    schema:about <http://id.worldcat.org/fast/1054040> ; # Particle acceleration
    schema:about <http://dewey.info/class/539.73/> ;
    schema:about <http://id.worldcat.org/fast/1063025> ; # Physics
    schema:bookFormat schema:EBook ;
    schema:creator <http://viaf.org/viaf/292262793> ; # Pei Zhang
    schema:datePublished "2013" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/1654673941> ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/1654673941#Series/springer_theses_recognizing_outstanding_ph_d_research> ; # Springer Theses, Recognizing Outstanding Ph. D. Research
    schema:name "Beam Diagnostics in Superconducting Accelerating Cavities : the Extraction of Transverse Beam Position from Beam-Excited Higher Order Modes" ;
    schema:productID "861540740" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/861540740#PublicationEvent/cham_springer_international_publishing_2013> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/1654673941#Agent/springer_international_publishing> ; # Springer International Publishing
    schema:url <http://swbplus.bsz-bw.de/bsz392254409cov.htm> ;
    schema:url <https://doi.org/10.1007/978-3-319-00759-5> ;
    schema:url <http://sfx.ethz.ch/sfx_locater?sid=ALEPH:EBI01&genre=book&isbn=9783319007588> ;
    schema:workExample <http://dx.doi.org/10.1007/978-3-319-00759-5> ;
    schema:workExample <http://worldcat.org/isbn/9783319007595> ;
    schema:workExample <http://worldcat.org/isbn/9783319007588> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/861540740> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/1654673941#Agent/springer_international_publishing> # Springer International Publishing
    a bgn:Agent ;
    schema:name "Springer International Publishing" ;
    .

<http://experiment.worldcat.org/entity/work/data/1654673941#Series/springer_theses_recognizing_outstanding_ph_d_research> # Springer Theses, Recognizing Outstanding Ph. D. Research
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/861540740> ; # Beam Diagnostics in Superconducting Accelerating Cavities : the Extraction of Transverse Beam Position from Beam-Excited Higher Order Modes
    schema:name "Springer Theses, Recognizing Outstanding Ph. D. Research" ;
    .

<http://id.worldcat.org/fast/1054040> # Particle acceleration
    a schema:Intangible ;
    schema:name "Particle acceleration" ;
    .

<http://id.worldcat.org/fast/1063025> # Physics
    a schema:Intangible ;
    schema:name "Physics" ;
    .

<http://viaf.org/viaf/292262793> # Pei Zhang
    a schema:Person ;
    schema:familyName "Zhang" ;
    schema:givenName "Pei" ;
    schema:name "Pei Zhang" ;
    .

<http://worldcat.org/isbn/9783319007588>
    a schema:ProductModel ;
    schema:isbn "3319007580" ;
    schema:isbn "9783319007588" ;
    .

<http://worldcat.org/isbn/9783319007595>
    a schema:ProductModel ;
    schema:isbn "3319007599" ;
    schema:isbn "9783319007595" ;
    .

<http://www.worldcat.org/title/-/oclc/861540740>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/861540740> ; # Beam Diagnostics in Superconducting Accelerating Cavities : the Extraction of Transverse Beam Position from Beam-Excited Higher Order Modes
    schema:dateModified "2019-06-15" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


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