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Beam Diagnostics in Superconducting Accelerating Cavities The Extraction of Transverse Beam Position from Beam-Excited Higher Order Modes

Author: Pei Zhang
Publisher: Cham Springer International Publishing 2013
Edition/Format:   Print book : EnglishView all editions and formats
Summary:
This work employs self-excited wakefields as a diagnostic to remotely determine the beam position within a superconducting cavity and chains thereof. Several numerical techniques are delineated in order to ascertain the most appropriate technique in terms of reliability and accuracy. The methodology is carefully explained making the presentation pedagogically appropriate to students new to the field as well as  Read more...
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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Pei Zhang
ISBN: 9783319007595 3319007599
OCLC Number: 980919460
Responsibility: Pei Zhang [aut]

Abstract:

This work employs self-excited wakefields as a diagnostic to remotely determine the beam position within a superconducting cavity and chains thereof. Several numerical techniques are delineated in order to ascertain the most appropriate technique in terms of reliability and accuracy. The methodology is carefully explained making the presentation pedagogically appropriate to students new to the field as well as researchers familiar with this topic. Pei Zhang's achievements will serve as a basis for the development of similar monitors at various other facilities around the world.

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